Variable frequency and non-sinusoidal power generator using double side cooling, plasma processing apparatus including the same and method of manufacturing semiconductor device using the same

ABSTRACT

A variable frequency and non-sinusoidal power generator includes a pulse module circuit, a slope module circuit, and first and second cooling systems. The pulse module circuit and the slope module circuit includes control switches, and generates at least one of a output currents and a output voltages by selectively turning on/off the control switches based on control signals. The first and second cooling systems are disposed at first and second sides of the control switches. A bias power having a variable frequency and a non-sinusoidal waveform is generated based on the control signals, at least one of the output currents and the output voltages.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims priority under 35 USC § 119 to Korean PatentApplication No. 10-2021-0021626 filed on Feb. 18, 2021 in the KoreanIntellectual Property Office (KIPO), the contents of which are hereinincorporated by reference in their entirety.

BACKGROUND

Some example embodiments relate generally to semiconductor manufacturingprocesses, and more particularly to variable frequency andnon-sinusoidal power generators using double side cooling, plasmaprocessing apparatuses including the variable frequency andnon-sinusoidal power generators, and/or methods of manufacturingsemiconductor devices using the plasma processing apparatuses.

Various types of semiconductor devices are manufactured using variousplasma-based etching techniques. For example, a plasma etching apparatussuch as an inductively coupled plasma (ICP) etching apparatus maygenerate plasma within a chamber to perform an etching process.

Semiconductor manufacturing processes using plasma rely on effectiveplasma control to achieve desired/requisite quality and/or manufacturingobjectives. With a typical plasma based semiconductor process, radiofrequency (RF) power of two different frequencies is used toindependently control ion energy and plasma density, respectively. Inaddition, as patterns of semiconductor devices get smaller, uniformitycontrol of the patterns may get more challenging. In order to improveetch uniformity between fine recess patterns in a cell region, a moreprecise plasma control may be beneficial.

SUMMARY

At least some example embodiments of inventive concepts provide avariable frequency and non-sinusoidal power generator capable ofefficiently generating power having a variable frequency and anon-sinusoidal waveform using double side cooling.

Alternatively or additionally, at least some example embodiments ofinventive concepts provide a plasma processing apparatus including thevariable frequency and non-sinusoidal power generator and capable ofefficiently improving plasma characteristics and etching performance.

Alternatively or additionally, at least some example embodiments ofinventive concepts provide a method of manufacturing a semiconductordevice using the plasma processing apparatus.

According to some example embodiments, a variable frequency andnon-sinusoidal power generator includes a pulse module circuitryincluding a plurality of pulse control switches, and configured togenerate at least one first output current or first output voltage, thegenerating the at least one first output current or first output voltageby selectively turning on and off the plurality of pulse controlswitches based on a plurality of pulse control signals, at least some ofthe plurality of pulse control switches being in series, a slope modulecircuitry including a plurality of slope control switches, andconfigured to generate at least one second output current or secondoutput voltage, the generating the at least one second output current orsecond output voltage by selectively turning on and off the plurality ofslope control switches based on a plurality of slope control signals, atleast some of the plurality of slope control switches being in series, afirst cooling system at a first side of the plurality of pulse controlswitches and the plurality of slope control switches, and a secondcooling system at a second side opposite to the first side of theplurality of pulse control switches and the plurality of slope controlswitches. The variable frequency and non-sinusoidal power generatorgenerates a bias power having a variable frequency and a non-sinusoidalwaveform based on the plurality of pulse control signals, the pluralityof slope control signals, at least one of the first output current orthe first output voltage, and at least one of the second output currentor the second output voltage.

According to some example embodiments, a plasma processing apparatusincludes a chamber, a substrate stage configured to support a substratewithin the chamber, and including a lower electrode, an upper electrodeover the lower electrode to face the substrate, a sinusoidal powergenerator configured to apply a plasma power to the upper electrode toform plasma within the chamber, the plasma power having a sinusoidalwaveform, and a variable frequency and non-sinusoidal power generatorconfigured to apply a bias power to the lower electrode, the bias powerhaving a variable frequency and a non-sinusoidal waveform. The variablefrequency and non-sinusoidal power generator includes, a pulse modulecircuitry including a plurality of pulse control switches, andconfigured to generate at least one of a first output current or a firstoutput voltage by selectively turning on and off the plurality of pulsecontrol switches, the turning on and off the plurality of pulse controlswitches based on a plurality of pulse control signals, at least some ofthe plurality of pulse control switches arranged in series, a slopemodule circuitry including a plurality of slope control switches, andconfigured to generate at least one of a second output current or asecond output voltage by selectively turning on and off the plurality ofslope control switches, the turning on and off the plurality of pulsecontrol switches based on a plurality of slope control signals, at leastsome of the plurality of slope control switches arranged in series, afirst cooling system at a first side of the plurality of pulse controlswitches and the plurality of slope control switches, and a secondcooling system at a second side opposite to the first side of theplurality of pulse control switches and the plurality of slope controlswitches. The variable frequency and non-sinusoidal power generator isconfigured to generate the bias power based on the plurality of pulsecontrol signals, the plurality of slope control signals, at least one ofthe first output current and the first output voltage, and at least oneof the second output current and the second output voltage.

According to some example embodiments, a variable frequency andnon-sinusoidal power generator includes a pulse module circuitryincluding a first current source and a plurality of pulse controlswitches, and configured to generate at least one of a first outputcurrent or a first output voltage by adjusting an amount of a firstinput current generated from the first current source based on a firstcurrent control signal and by selectively turning on and off theplurality of pulse control switches, the turning on and off theplurality of pulse control switches based on a plurality of pulsecontrol signals, at least some of the plurality of pulse controlswitches arranged in series, a slope module circuitry including a secondcurrent source and a plurality of slope control switches, and configuredto generate at least one of a second output current or a second outputvoltage by adjusting an amount of a second input current generated fromthe second current source based on a second current control signal andby selectively turning on and off the plurality of slope controlswitches, the selectively turning on and off the plurality of slopecontrol switches based on a plurality of slope control signals, at leastsome of the plurality of slope control switches being arranged inseries, a control signal generator circuitry configured to generate thefirst current control signal, the plurality of pulse control signals,the second current control signal, and the plurality of slope controlsignals, a first cooling system at a first side of the plurality ofpulse control switches and the plurality of slope control switches, asecond cooling system at a second side opposite to the first side of theplurality of pulse control switches and the plurality of slope controlswitches, a cold plate including a plurality of fin structures, andarranged between the first cooling system and at least one of theplurality of pulse control switches and the plurality of slope controlswitches, and a thermal pad between the cold plate and at least one ofthe plurality of pulse control switches and the plurality of slopecontrol switches. The variable frequency and non-sinusoidal powergenerator is configured to generate a bias power having a variablefrequency and a non-sinusoidal waveform based on the plurality of pulsecontrol signals, the plurality of slope control signals, at least one ofthe first output current or the first output voltage, and at least oneof the second output current or the second output voltage, the biaspower has a voltage waveform that repeats every period, and the periodincludes a pulse interval in which the bias power has a first fixedvoltage level that is greater than a reference voltage level, a rampinterval in which the bias power has a first variable voltage level thatis less than the reference voltage level and decreases with a constantslope, a first transition interval for changing the pulse interval tothe ramp interval, and a second transition interval for changing theramp interval to the pulse interval.

According to some example embodiments, a method of manufacturing asemiconductor device includes performing plasma processing on asubstrate, and fabricating the semiconductor device using the substrateon which the plasma processing is performed. The performing the plasmaprocessing on the substrate includes loading the substrate onto a lowerelectrode within a chamber, applying, by a sinusoidal power generator, aplasma power to an upper electrode to form plasma within the chamber,the plasma power having a sinusoidal waveform, and applying, by avariable frequency and non-sinusoidal power generator, a bias power tothe lower electrode, the bias power having a variable frequency and anon-sinusoidal waveform. The applying the bias power to the lowerelectrode includes generating at least one of a first output current ora first output voltage by selectively turning on and off a plurality ofpulse control switches included in the variable frequency andnon-sinusoidal power generator, the selectively turning on and off theplurality of pulse control switches based on a plurality of pulsecontrol signals, generating at least one of a second output current anda second output voltage by selectively turning on and off a plurality ofslope control switches included in the variable frequency andnon-sinusoidal power generator, the selectively turning on and off theslope control switches based on a plurality of slope control signals,generating the bias power based on at least one of the first outputcurrent or the first output voltage, and at least one of the secondoutput current or the second output voltage, and cooling the pluralityof pulse control switches and the plurality of slope control switchesusing a first cooling system and a second cooling system, the firstcooling system and the second cooling system included in the variablefrequency and non-sinusoidal power generator, the first cooling systemat a first side of the plurality of pulse control switches and theplurality of slope control switches, the second cooling system at asecond side opposite to the first side of the plurality of pulse controlswitches and the plurality of slope control switches.

The variable frequency and non-sinusoidal power generator according tosome example embodiments may be implemented with a structure forchanging the frequency of the bias power having the non-sinusoidalwaveform and a structure for reducing the heat generation. For example,to distribute the high voltage and the heat generation, the powerelements may be implemented in series and to simultaneously turn on thepower elements, the passive balancing scheme may be applied.Alternatively or additionally, to increase the cooling performance, thedouble side cooling may be applied such that the cooling means aredisposed at both sides (e.g., the upper and lower sides) with respect tothe power elements. Accordingly, the power having the variable frequencyand the non-sinusoidal waveform may be efficiently generated.

The plasma processing apparatus according to some example embodimentsmay include the variable frequency and non-sinusoidal power generatoraccording to some example embodiments. Thus, the ion energy having arelatively narrow single peak may be formed, the etching profile of thesemiconductor device may be improved, and/or bowing or loss ofanisotropy may be reduced. Alternatively or additionally, the plasmadensity in the radial direction of the wafer may be controlled by thefrequency change, and thus the etching distribution in the radialdirection of the wafer may be controlled. Accordingly, the plasmacharacteristic and the etching performance may be efficiently improved.

BRIEF DESCRIPTION OF THE DRAWINGS

Illustrative, non-limiting some example embodiments will be more clearlyunderstood from the following detailed description taken in conjunctionwith the accompanying drawings.

FIG. 1 is a block diagram illustrating a plasma processing apparatusaccording to some example embodiments.

FIG. 2 is a diagram illustrating plasma generated within a chamber of aplasma processing apparatus in FIG. 1 .

FIG. 3 is a waveform diagram illustrating a plasma power generated froma sinusoidal power generator of a plasma processing apparatus accordingto some example embodiments.

FIG. 4 is a block diagram illustrating a variable frequency andnon-sinusoidal power generator according to some example embodiments.

FIG. 5 is a waveform diagram illustrating a bias power generated from avariable frequency and non-sinusoidal power generator according to someexample embodiments.

FIG. 6 is a circuit diagram illustrating an example of a variablefrequency and non-sinusoidal power generator of FIG. 4 .

FIG. 7 is a diagram illustrating an operation of a variable frequencyand non-sinusoidal power generator of FIG. 6 .

FIGS. 8, 9 and 10 are diagrams illustrating a variable frequency andnon-sinusoidal power generator according to some example embodiments.

FIGS. 11A, 11B, 12A, 12B, 13, 14, 15, 16, 17 and 18 are diagrams fordescribing an operation of a variable frequency and non-sinusoidal powergenerator according to some example embodiments.

FIGS. 19A, 19B, 19C, 19D, 19E, 19F and 19G are diagrams for describingan operation of a variable frequency and non-sinusoidal power generatoraccording to some example embodiments.

FIG. 20 is a flowchart illustrating a method of generating a variablefrequency and non-sinusoidal power according to some exampleembodiments.

FIG. 21 is a flowchart illustrating a method of performing plasmaprocessing according to some example embodiments.

FIG. 22 is a flowchart illustrating a method of manufacturing asemiconductor device according to some example embodiments.

DETAILED DESCRIPTION OF SOME EXAMPLE EMBODIMENTS

Various some example embodiments will be described more fully withreference to the accompanying drawings, in which embodiments are shown.Inventive concepts may, however, be embodied in many different forms andshould not be construed as limited to the embodiments set forth herein.Like reference numerals refer to like elements throughout thisapplication.

FIG. 1 is a block diagram illustrating a plasma processing apparatusaccording to some example embodiments. FIG. 2 is a diagram illustratingplasma generated within a chamber of a plasma processing apparatus inFIG. 1 .

Referring to FIGS. 1 and 2 , a plasma processing apparatus 10 includes achamber 20, a chuck or a substrate stage including a lower electrode 40,an upper electrode 50, a sinusoidal power generator 51, a variablefrequency and non-sinusoidal power generator 41, and a controller 80.The plasma processing apparatus 10 may further include other componentssuch as a gas supply unit, a gas exhaust unit 26, etc.

In some example embodiments, the plasma processing apparatus 10 may beor may include an inductively coupled plasma (ICP) apparatus configuredto etch a layer (e.g., an object layer) on a substrate W such as asemiconductor wafer that is disposed within the chamber 20. However,some example embodiments are not limited thereto, and the plasmaprocessing apparatus 10 may be or may include at least one of acapacitively coupled plasma (CCP) apparatus, a microwave plasmaapparatus, etc. For example, plasma such as at least one of ICP, CCP,microwave plasma, etc., may be generated by the plasma processingapparatus 10. For example, the plasma processing apparatus 10 mayinclude one or more of each of or at least two of an ICP chamber, a CCPchamber, and a microwave plasma chamber, which include differentcomponents from each other. Alternatively or additionally, the plasmaprocessing apparatus 10 may not be limited to the etching apparatus, andfor example, the plasma processing apparatus 10 may be or may include atleast one of a deposition apparatus (e.g. a chemical vapor deposition(CVD) apparatus), a cleaning apparatus (e.g. an ashing apparatus), etc.Alternatively or additionally, the substrate W may include asemiconductor substrate such as a wafer, a glass substrate, etc.

The chamber 20 may provide a sealed space where a plasma etching processis performed on the substrate W. For example, the chamber 20 may be ormay include a cylindrical vacuum chamber. For example, the chamber 20may include a metal such as at least one of aluminum, stainless steel,etc.

The substrate stage may be disposed or arranged within the chamber 20 tosupport the substrate W. For example, the substrate stage may serve as asusceptor for supporting the substrate W thereon. The substrate stagemay include a chuck such as an electrostatic chuck 30 for holding thesubstrate W using electrostatic force. The substrate W may be held onthe electrostatic chuck 30 in an adsorptive manner when a direct current(DC) power (e.g., a DC voltage) is applied thereto from a DC powergenerator 70.

The lower electrode 40 included in the substrate stage may have acircular plate-shape, and the lower electrode 40 may be disposed underthe electrostatic chuck 30. The lower electrode 40 may be supported by adriving portion 34 such that the lower electrode 40 may move vertically,e.g. upward and downward. For example, the lower electrode 40 and/or thesubstrate stage may be moved up and down by the driving arm/drivingportion 34. The lower electrode 40 may be referred to as a substrateelectrode.

The substrate W may be mounted on an upper surface of the electrostaticchuck 30, and a focus ring (not illustrated) may be installed on thesubstrate stage to surround the substrate W. The lower electrode 40 mayhave a diameter greater than a diameter of the substrate W. The lowerelectrode 40 may have a cooling channel (not illustrated) therein. Toincrease a control accuracy of a substrate temperature, a heat transfergas such as a He gas and/or another inert gas may be supplied to a gapbetween the electrostatic chuck 30 and the substrate W.

A door or gate (not illustrated) for loading and/or unloading thesubstrate W may be provided in a sidewall of the chamber 20. Thesubstrate W may be loaded/unloaded onto/from the substrate stage throughthe gate.

A gas exhaust port 24 may be provided in a bottom portion of the chamber20. The gas exhaust pipe/gas exhaust unit 26 may be connected to the gasexhaust port 24 through a gas exhaust line. The gas exhaust unit 26 mayinclude a vacuum pump such as a turbo-molecular pump and/or the like, tocontrol a pressure of the chamber 20 such that the processing space inthe chamber 20 may be depressurized to a desired (or proper orpredetermined) vacuum level. Additionally or alternatively, processby-products and/or residual process gases may be discharged through thegas exhaust port 24.

The chamber 20 may include a top or cover 22 covering an upper portionof the chamber 20. The cover 22 may seal the upper portion of thechamber 20 airtight. The upper electrode 50 may be disposed outside thechamber 20 such that the upper electrode 50 faces or opposes the lowerelectrode 40. The upper electrode 50 may be disposed on the cover 22.The upper electrode 50 may include a radio frequency (RF) antenna. Forexample, the RF antenna may have a coil shape when viewed in a planview. For example, the RF antenna may have a spiral shape emanating froma center of an upper surface of the cover 22 and moving farther away asit revolves around the center of the upper surface of the cover 22. Thecover 22 may include a circular plate dielectric window. The dielectricwindow may include a dielectric material. For example, the dielectricwindow may include alumina (Al₂O₃). An electromagnetic signal generatedfrom the sinusoidal power generator 51 may be transferred from theantenna into the chamber 20 through the dielectric window.

For example, the upper electrode 50 may include an inner coil 50 a andan outer coil 50 b. Either or both of the inner coil 50 a and the outercoil 50 b may have a spiral shape and/or a concentric shape. The innercoil 50 a and the outer coil 50 b may generate inductively coupledplasma in a plasma space P of the chamber 20. Although two coils 50 aand 50 b are described exemplarily, it may be understood that thenumber, arrangement, etc. of the coils may not be limited thereto, andthere may be one coil, or more than two coils.

In some example embodiments, the gas supply unit may include gas supplylines 60 a and 60 b, a flow controller 62 (e.g. a mass flow controller)and a gas source 64, such as a gas reservoir. For example, the gassupply unit may refer to a set of gas supplying elements. The gas supplylines 60 a and 60 b may be connected to the upper portion and/or a sideportion of the chamber 20 to supply gases into the chamber 20therethrough. For example, the gas supply lines may include a verticalgas supply line 60 a which is connected to the chamber 20 through thecover 22 and a horizontal gas supply line 60 b connected to the chamber20 through the sidewall of the chamber 20. Various gases such asreactive gases and/or inert gases may be supplied into the plasma spaceP of the chamber 20 through the vertical gas supply line 60 a and thehorizontal gas supply line 60 b.

The gas supply unit may supply different gases having adesired/predetermined mixture ratio. The gas source 64 may store thegases, and the gases may be supplied through a plurality of gas linesconnected to the gas supply lines 60 a and 60 b respectively. The flowcontroller 62 may control the amount of the gases supplied into thechamber 20 through the gas supply lines 60 a and 60 b. The flowcontroller 62 may control independently and/or commonly the amount ofthe gases supplied to the vertical gas supply line 60 a and thehorizontal gas supply line 60 b respectively. For example, the gassource 64 may include a plurality of gas tanks, and the flow controller62 may include a plurality of mass flow controllers (MFCs) correspondingto the gas tanks, e.g., respectively connected to the gas tanks;however, example embodiments are not limited thereto. The mass flowcontrollers may control independently the amount of the gasesrespectively.

The gas supply unit may supply different process gases into the chamber20. For example, the process gases may include inert gases such as Heand/or N2.

The sinusoidal power generator 51 may apply a plasma power (e.g., aplasma voltage) to the upper electrode 50. The plasma power may have asinusoidal waveform, e.g. may have a frequency spectrum having aspecific, single frequency. The sinusoidal power generator 51 may applythe plasma power to the upper electrode 50 to form the plasma within thechamber 20. The sinusoidal power generator 51 may be referred to as afirst power generator and/or a plasma power supply, and the plasma powermay be referred to as a plasma source power.

The variable frequency and non-sinusoidal power generator 41 may apply abias power (e.g., a bias voltage) to the lower electrode 40. The biaspower may have a variable frequency and a non-sinusoidal waveform, e.g.may have a frequency spectrum having a plurality of frequencies. Thevariable frequency and non-sinusoidal power generator 41 may be referredto as a second power generator or a bias power supply, and the biaspower may be referred to as a bias source power.

The controller 80 may be connected to the sinusoidal power generator 51and the variable frequency and non-sinusoidal power generator 41, andmay control operations thereof. The controller 80 may be or may includea microcomputer and various interface circuits, and may control anoperation of the plasma processing apparatus 10 based on programs andrecipe information stored in and/or downloaded from an external orinternal memory.

For example, the controller 80 may be or may include a computer (orseveral interconnected computers) command include, for example, one ormore processors configured by software, such as a CPU (CentralProcessing Unit), controller, etc., forming various functional modulesof the computer. The computer may be or may include a general purposecomputer or may be dedicated hardware or firmware (e.g., an electronicor optical circuit, such as application-specific hardware, such as, forexample, a digital signal processor (DSP) or a field-programmable gatearray (FPGA)). A computer may be configured from several interconnectedcomputers. Each functional module (or unit) described herein maycomprise a separate computer, or some or all of the functional module(or unit) may be comprised of and share the hardware of the samecomputer. Connections and interactions between the units describedherein may be hardwired and/or in the form of data (e.g., as data storedin and retrieved from memory of the computer, such as a register,buffer, cache, storage drive, etc., such as part of an applicationprogramming interface (API)). As is understood, “software” refers toprescribed rules to operate a computer, such as code or script.

For example, the sinusoidal power generator 51 may include an RF powersource 54 and an RF matcher 52 as plasma source elements. The RF powersource 54 may generate an RF signal. The RF matcher 52 may match animpedance of the RF signal generated from the RF power source 54 usingthe coils 50 a and 50 b to control generation of the plasma.

The sinusoidal power generator 51 may apply a RF power signal (e.g., theplasma power) to the upper electrode 50 based on a plasma power controlsignal provided from the controller 80. For example, the RF power signalmay be generated to have a frequency range of about 13 MHz to about 2.45GHz, and may be generated to have an RF power range of about 100 W toabout 1000 W.

As the RF power signal having a specific (or, predetermined) frequency(e.g., 13.56 MHz) is applied to the upper electrode 50, anelectromagnetic field induced by the upper electrode 50 may be appliedto a source gas supplied within the chamber 20 to generate the plasma.

The variable frequency and non-sinusoidal power generator 41 may apply abias power signal (e.g., the bias power) to the lower electrode 40 basedon a bias power control signal provided from the controller 80. Thevariable frequency and non-sinusoidal power generator 41 may apply thebias power signal having a desired frequency and a desirednon-sinusoidal voltage waveform to the lower electrode 40.

The frequency and the voltage waveform of the bias power signal appliedby the variable frequency and non-sinusoidal power generator 41 may becontrolled such that a desired/predetermined voltage and adesired/predetermined ion energy distribution may be generated on ornear a surface of a substrate W and a desired/predetermined ion flux anda desired/predetermined etching rate may be obtained. Detailedconfigurations and operations of the variable frequency andnon-sinusoidal power generator 41 will be described later.

In some example embodiments, the plasma processing apparatus 10 mayinclude a temperature control device, e.g. within the substrate stage.The temperature control device may include a heater and/or a cooler. Forexample, the temperature control device may include a heater 32 withinthe electrostatic chuck 30 to control a temperature of the electrostaticchuck 30, a heater power supply 70 configured to supply a power to theheater 32, and a filter 72 disposed between the heater 32 and the heaterpower supply 70.

In some example embodiments, the plasma processing apparatus 10 mayfurther include a sinusoidal power generator for applying a bias powerhaving a sinusoidal waveform to the lower electrode 40, and a switchingcircuit for simultaneously or selectively applying the bias power havingthe sinusoidal waveform and the bias power having the non-sinusoidalwaveform.

FIG. 3 is a waveform diagram illustrating a plasma power generated froma sinusoidal power generator of a plasma processing apparatus accordingto some example embodiments.

Referring to FIG. 3 , a plasma power (or plasma voltage) PV may have asinusoidal waveform. For example, the plasma power PV may have a voltagewaveform of a sinusoidal wave that is repeated everyspecific/predetermined period TPV, and may have a frequencycorresponding to the period TPV. For example, the plasma power PV mayhave or operate with a fixed frequency or significantly fixed frequency.

FIG. 4 is a block diagram illustrating a variable frequency andnon-sinusoidal power generator according to some example embodiments.

Referring to FIG. 4 , a variable frequency and non-sinusoidal powergenerator 100 includes a pulse module circuit 110 and a slope modulecircuit 120. The variable frequency and non-sinusoidal power generator100 may further include a control signal generator 130 and/or a plasmaload 140.

The pulse module circuit 110 may generate a first output current IO1based on a plurality of pulse control signals PC and on a first currentcontrol signal CC1. For example, the pulse module circuit 110 mayinclude a plurality of pulse control switches (or power elements), andone or more of the plurality of pulse control switches may be arrangedin series. The pulse module circuit 110 may generate the first outputcurrent IO1 by selectively turning on and off the plurality of pulsecontrol switches based on the plurality of pulse control signals PC. Theamount of the first output current IO1 may be changed or adjusted basedon the plurality of pulse control signals PC and the first currentcontrol signal CC1. Alternatively or additionally, the pulse modulecircuit 110 may generate a first output voltage corresponding to thefirst output current IO1, or may generate both the first output currentIO1 and the first output voltage. For example, the pulse module circuit110 may generate at least one of the first output current IO1 and thefirst output voltage.

In some example embodiments, the pulse module circuit 110 may include ahigh current source that generates a relatively large amount of inputcurrent (or source current), may be implemented using series-connectedswitches of a half bridge structure, and may generate a pulse voltagehaving a rectangular waveform by generating positive and negativecurrents. The rectangular waveform may have a duty ratio of one-to-one;however, example embodiments are not limited thereto, and the duty ratioof the rectangular waveform may not be one-to-one.

The slope module circuit 120 may generate a second output current IO2based on a plurality of slope control signals SC and a second currentcontrol signal CC2. For example, the slope module circuit 120 mayinclude a plurality of slope control switches, and at least some of theplurality of slope control switches may be arranged in series. The slopemodule circuit 120 may generate the second output current IO2 byselectively turning on and off the plurality of slope control switchesbased on the plurality of slope control signals SC. The amount of thesecond output current IO2 may be changed based on the plurality of slopecontrol signals SC and the second current control signal CC2.Alternatively or additionally, the slope module circuit 120 may generatea second output voltage corresponding to the second output current IO2,or may generate both the second output current IO2 and the second outputvoltage. For example, the slope module circuit 120 may generate at leastone of the second output current IO2 and the second output voltage.

In some example embodiments, the slope module circuit 120 may include alow current source that generates a relatively small amount of inputcurrent (or source current), may be implemented using series-connectedswitches of a half bridge structure similar to the pulse module circuit110, and may generate a slope voltage (e.g., a voltage that partiallyoverlaps a negative voltage having a rectangular waveform and has anegative slope) by generating positive and negative currents. Therectangular waveform may have a duty-ratio of one-to-one; however,example embodiments are not limited thereto.

Detailed configurations of operations of the pulse module circuit 110and the slope module circuit 120 will be described with reference toFIGS. 6 and 7 .

The plasma load 140 may be connected to outputs of the pulse modulecircuit 110 and the slope module circuit 120, may receive a load currentIL corresponding to the sum of the first and second output currents IO1and IO2, and may generate a bias power (e.g., a bias power BV in FIG. 5) based on the load current IL. For example, the plasma load 140 may bemodeled as a circuit including at least one resistor and at least onecapacitor in series and/or parallel with the at least one resistor, andmay generate a voltage (e.g., the bias power BV) by applying a current(e.g., the load current IL).

As described above, at least one of the first output current IO1 and thefirst output voltage may be generated and at least one of the secondoutput current IO2 and the second output voltage may be generated basedon the plurality of pulse control signals PC, the plurality of slopecontrol signals SC, and the first and second current control signals CC1and CC2. Alternatively or additionally, the bias power BV having avariable frequency and a non-sinusoidal waveform may be generated basedon at least one of the first output current IO1 and the first outputvoltage, and at least one of the second output current IO2 and thesecond output voltage (e.g., based on the load current IL).

The control signal generator 130 may generate the plurality of pulsecontrol signals PC, the plurality of slope control signals SC, and thefirst and second current control signals CC1 and CC2. In some exampleembodiments, the control signal generator 130 may be disposed outsidethe variable frequency and non-sinusoidal power generator 100 (e.g.,disposed in the controller 80 of FIG. 1 ).

In some example embodiments, the control signal generator 130 may changeor adjust the frequency of the bias power BV based on the plurality ofpulse control signals PC and the plurality of slope control signals SC.For example, the control signal generator 130 may adjust at least one ofturn-on times, turn-off times and/or switching timings (or switchingspeeds) of the plurality of pulse control switches and the plurality ofslope control switches by controlling time intervals in which theplurality of pulse control signals PC and the plurality of slope controlsignals SC have high levels and low levels, and thus may change thefrequency of the bias power BV based thereon.

As described above, as the frequency of the bias power BV is changed(e.g., increased), the amount of heat generated and/or emitted from thepulse module circuit 110 and the slope module circuit 120 (e.g., fromthe plurality of pulse control switches and the plurality of slopecontrol switches) may increase. Therefore, the variable frequency andnon-sinusoidal power generator 100 may include a cooling system orcooling means for controlling heat generation, and for example, mayinclude first and second cooling systems or cooling means implemented bydouble sided cooling. Configurations of the first and second coolingmeans will be described with reference to FIGS. 8, 9 and 10 .

FIG. 5 is a waveform diagram illustrating a bias power generated from avariable frequency and non-sinusoidal power generator according to someexample embodiments.

Referring to FIG. 5 , the bias power (or bias voltage) BV may begenerated based on the load current IL, and may have a non-sinusoidalwaveform. For example, the bias power BV may have a voltage waveform ofa non-sinusoidal wave that is repeated every specific or predeterminedperiod TBV.

The period TBV of the bias power BV may include a pulse interval T1, afirst transition interval T2, a ramp down or ramp interval T3, and asecond transition interval T4. The pulse interval T1 may represent atime interval in which the bias power BV has a fixed voltage levelhigher than or greater than a reference voltage level (e.g., about 0V).The ramp interval T3 may represent a time interval in which the biaspower BV has a variable voltage level that is lower than or less thanthe reference voltage level and decreases with a constant slope. Thefirst transition interval T2 may be for changing the pulse interval T1to the ramp interval T3, may be disposed between or occur between thepulse interval T1 and the ramp interval T3, and may represent a timeinterval the bias power BV is transitioned from a positive voltage levelto a negative voltage level. The second transition interval T4 may befor changing the ramp interval T3 to the pulse interval T1, may bedisposed between or occur between the ramp interval T3 and the pulseinterval T1, and may represent a time interval the bias power BV istransitioned from a negative voltage level to a positive voltage level.

The bias power BV may have a frequency, e.g. a fundamental frequency,corresponding to the period TBV, and the frequency of the bias power BVmay be changed or adjusted. For example, the frequency of the bias powerBV may be changed by adjusting lengths of the pulse interval T1, thefirst transition interval T2, the ramp interval T3 and the secondtransition interval T4 based on the plurality of pulse control signalsPC and the plurality of slope control signals SC. For example, thefrequency of the bias power BV may be changed in a range of about 100kHz to about 800 kHz. However, example embodiments are not limitedthereto, and the frequency of the bias power supply BV may be changed ina range of about 1 kHz to about 10 MHz.

In some example embodiments, the lengths of the first transitioninterval T2 and the second transition interval T4 may be very shortcompared to the lengths of the pulse interval T1 and the ramp intervalT3, e.g. may be one or more orders of magnitude shorter compared to thelengths of the pulse interval T1 and the ramp interval T3. Forconvenience of illustration, the first transition interval T2 and thesecond transition interval T4 may be omitted in subsequent figures suchas FIG. 11A.

FIG. 6 is a circuit diagram illustrating an example of a variablefrequency and non-sinusoidal power generator of FIG. 4 . Thedescriptions repeated with FIG. 4 will be omitted for brevity.

Referring to FIG. 6 , a variable frequency and non-sinusoidal powergenerator 100 a includes a pulse module circuit 110 a and a slope modulecircuit 120 a. The variable frequency and non-sinusoidal power generator100 a may further include the plasma load 140. For convenience ofillustration, the control signal generator 130 is omitted in FIG. 6 .

The plasma load 140 may be connected between a first output node NO1 anda second output node NO2, and may generate the bias power BV based onthe load current IL provided from the pulse module circuit 110 a and theslope module circuit 120 a.

The pulse module circuit 110 a may include a first current source 111, afirst control circuit 112, a second control circuit 114, a third controlcircuit 116 and a fourth control circuit 118.

The first current source 111 may be connected between a first node N1and a second node N2, and may generate a first input current IS1. Atleast one of the first output current IO1 and the first output voltagemay be generated based on the first input current IS1. Alternatively oradditionally, the first current source 111 may change the amount of thefirst input current IS1 based on the first current control signal CC1.When the amount of the first input current IS1 is changed, the fixedvoltage level of the bias power BV in the pulse interval T1 and thevariable voltage level of the bias power BV in the ramp interval T3 maybe changed, and thus an amplitude of the bias power BV may be changed.

The first control circuit 112 may be connected between the first node N1and the first output node NO1, and may include first switches S11, . . ., S1N and first diodes D11, . . . , D1N, where N is a natural numbergreater than or equal to two. The first switches S11, . . . , S1N may beturned on and off based on a first pulse control signal PC1. The firstswitches S11, . . . , S1N and the first diodes D11, . . . , D1N may bealternately disposed between the first node N1 and the first output nodeNO1, and may be connected in series. For example, the first switch S11,the first diode D11, . . . , the first switch S1N and the first diodeD1N may be sequentially disposed and connected.

Each of the second control circuit 114, the third control circuit 116and the fourth control circuit 118 may have a configuration or topologyor network similar to that of the first control circuit 112.

For example, the second control circuit 114 may be connected between thefirst node N1 and the second output node NO2, and may include secondswitches S21, . . . , S2N and second diodes D21, . . . , D2N. The secondswitches S21, . . . , S2N may be turned on and off based on a secondpulse control signal PC2. The second switches S21, . . . , S2N and thesecond diodes D21, . . . , D2N may be alternately disposed between thefirst node N1 and the second output node NO2, and may be connected inseries.

The third control circuit 116 may be connected between the first outputnode NO1 and the second node N2, and may include third switches S31, . .. , S3N and third diodes D31, . . . , D3N. The third switches S31, . . ., S3N may be turned on and off based on a third pulse control signalPC3. The third switches S31, . . . , S3N and the third diodes D31, . . ., D3N may be alternately disposed between the first output node NO1 andthe second node N2, and may be connected in series.

The fourth control circuit 118 may be connected between the secondoutput node NO2 and the second node N2, and may include fourth switchesS41, . . . , S4N and fourth diodes D41, . . . , D4N. The fourth switchesS41, . . . , S4N may be turned on and off based on a fourth pulsecontrol signal PC4. The fourth switches S41, . . . , S4N and the fourthdiodes D41, . . . , D4N may be alternately disposed between the secondoutput node NO2 and the second node N2, and may be connected in series.

The first switches S11, . . . , S1N, the second switches S21, . . . ,S2N, the third switches S31, . . . , S3N and the fourth switches S41, .. . , S4N may correspond to the plurality of pulse control switchesdescribed with reference to FIG. 4 . The first pulse control signal PC1,the second pulse control signal PC2, the third pulse control signal PC3and the fourth pulse control signal PC4 may correspond to the pluralityof pulse control signals PC described with reference to FIG. 4 .

The slope module circuit 120 a may include a second current source 121,a fifth control circuit 122, a sixth control circuit 124, a seventhcontrol circuit 126 and an eighth control circuit 128. The slope modulecircuit 120 a may have a configuration or topology or network similar tothat of the pulse module circuit 110 a.

The second current source 121 may be connected between a third node N3and a fourth node N4, and may generate a second input current IS2. Atleast one of the second output current IO2 and the second output voltagemay be generated based on the second input current IS2. In addition, thesecond current source 121 may change the amount of the second inputcurrent IS2 based on the second current control signal CC2. When theamount of the second input current IS2 is changed, the slope of thevariable voltage level of the bias power BV in the ramp interval T3 maybe changed.

In some example embodiments, the amount of the first input current IS1may be greater than the amount of the second input current IS2. Asillustrated in FIG. 5 , the amount of the first input current IS1 may berelatively large such that the amount of the load current IL having anegative current level is relatively large during the first transitioninterval T2 and the amount of the load current IL having a positivecurrent level is relatively large during the second transition intervalT4. Alternatively or additionally, the amount of the second inputcurrent IS2 may be relatively small such that the amount of the loadcurrent IL having a negative current level is relatively small duringthe ramp interval T3.

The fifth control circuit 122 may be connected between the third node N3and the first output node NO1, and may include fifth switches S51, . . ., S5N and fifth diodes D51, . . . , D5N. The fifth switches S51, . . . ,S5N may be turned on and off based on a first slope control signal SC1.The fifth switches S51, . . . , S5N and the fifth diodes D51, . . . ,D5N may be alternately disposed between the third node N3 and the firstoutput node NO1, and may be connected in series.

Each of the sixth control circuit 124, the seventh control circuit 126and the eighth control circuit 128 may have a configuration or topologyor network similar to that of the fifth control circuit 122.

For example, the sixth control circuit 124 may be connected between thethird node N3 and the second output node NO2, and may include sixthswitches S61, . . . , S6N and sixth diodes D61, . . . , D6N. The sixthswitches S61, . . . , S6N may be turned on and off based on a secondslope control signal SC2. The sixth switches S61, . . . , S6N and thesixth diodes D61, . . . , and D6N may be alternately disposed betweenthe third node N3 and the second output node NO2, and may be connectedin series.

The seventh control circuit 126 may be connected between the firstoutput node NO1 and the fourth node N4, and may include seventh switchesS71, . . . , S7N and seventh diodes D71, . . . , D7N. The seventhswitches S71, . . . , S7N may be turned on and off based on a thirdslope control signal SC3. The seventh switches S71, . . . , S7N and theseventh diodes D71, . . . , D7N may be alternately disposed between thefirst output node NO1 and the fourth node N4, and may be connected inseries.

The eighth control circuit 128 may be connected between the secondoutput node NO2 and the fourth node N4, and may include eighth switchesS81, S8N and eighth diodes D81, D8N. The eighth switches S81, S8N may beturned on and off based on a fourth slope control signal SC4. The eighthswitches S81, S8N and the eighth diodes D81, . . . , D8N may bealternately disposed between the second output node NO2 and the fourthnode N4, and may be connected in series.

The fifth switches S51, . . . , S5N, the sixth switches S61, S6N, theseventh switches S71, . . . , S7N and the eighth switches S81, S8N maycorrespond to the plurality of slope control switches described withreference to FIG. 4 . The first slope control signal SC1, the secondslope control signal SC2, the third slope control signal SC3 and thefourth slope control signal SC4 may correspond to the plurality of slopecontrol signals SC described with reference to FIG. 4 .

In some example embodiments, each of or any of the switches S11 to S1N,S21 to S2N, S31 to S3N, S41 to S4N, S51 to S5N, S61 to S6N, S71 to S7Nand S81 to S8N may include any transistor such as at least one of ametal oxide semiconductor field effect transistor (MOSFET), an insulatedgate bipolar transistor (IGBT), a thyristor, a gate turn-off thyristor(GTO), and/or the like, and each of the control signals PC1 to PC4 andSC1 to SC4 may be applied to a gate electrode of the transistor. Theswitches S11 to S1N, S21 to S2N, S31 to S3N, S41 to S4N, S51 to S5N, S61to S6N, S71 to S7N and S81 to S8N may be transistors of the same orsimilar type or structure; however, example embodiments are not limitedthereto. For example, at least one of the switches S11 to S1N, S21 toS2N, S31 to S3N, S41 to S4N, S51 to S5N, S61 to S6N, S71 to S7N and S81to S8N may have a different threshold voltage and/or a different channelwidth and/or a different oxide thickness than others of the switches S11to S1N, S21 to S2N, S31 to S3N, S41 to S4N, S51 to S5N, S61 to S6N, S71to S7N and S81 to S8N.

FIG. 7 is a diagram illustrating an operation of a variable frequencyand non-sinusoidal power generator of FIG. 6 .

Referring to FIG. 7 , the switches included in one control circuit ofthe pulse module circuit 110 a and the slope module circuit 120 a may besimultaneously switched or turned on and off. The load current IL andthe bias power BV in FIG. 5 may be generated by performing switchingoperations by the switches S11 to S1N, S21 to S2N, S31 to S3N, S41 toS4N, S51 to S5N, S61 to S6N, S71 to S7N and S81 to S8N, as illustratedby a table in FIG. 7 .

For example, during the pulse interval T1, the second switches S21 toS2N, the fourth switches S41 to S4N, the sixth switches S61 to S6N, andthe eighth switches S81 to S8N may be simultaneously turned on, and thefirst switches S11 to S1N, the third switches S31 to S3N, the fifthswitches S51 to S5N, and the seventh switches S71 to S7N may besimultaneously turned off, based on the control signals PC1 to PC4 andSC1 to SC4.

During the first transition interval T2, the second switches S21 to S2N,the third switches S31 to S3N, the sixth switches S61 to S6N, and theeighth switches S81 to S8N may be simultaneously turned on, and thefirst switches S11 to S1N, the fourth switches S41 to S4N, the fifthswitches S51 to S5N, and the seventh switches S71 to S7N may besimultaneously turned off, based on the control signals PC1 to PC4 andSC1 to SC4.

During the ramp interval T3, the first switches S11 to S1N, the thirdswitches S31 to S3N, the sixth switches S61 to S6N, and the seventhswitches S71 to S7N may be simultaneously turned on, and the secondswitches S21 to S2N, the fourth switches S41 to S4N, the fifth switchesS51 to S5N, and the eighth switches S81 to S8N may be simultaneouslyturned off, based on the control signals PC1 to PC4 and SC1 to SC4.

During the second transition interval T4, the first switches S11 to S1N,the fourth switches S41 to S4N, the fifth switches S51 to S5N, and theseventh switches S71 to S7N may be simultaneously turned on, and thesecond switches S21 to S2N, the third switches S31 to S3N, the sixthswitches S61 to S6N, and the eighth switches S81 to S8N may besimultaneously turned off, based on the control signals PC1 to PC4 andSC1 to SC4.

As described above, the frequency of the bias power BV may be changed byadjusting the lengths of the pulse interval T1, the first transitioninterval T2, the ramp interval T3 and the second transition interval T4based on the control signals PC1 to PC4 and SC1 to SC4.

The variable frequency and non-sinusoidal power generator according tosome example embodiments may be implemented and may operate asillustrated in FIGS. 4, 5, 6 and 7 . Since the variable frequency andnon-sinusoidal power generator has a circuit structure for waveformand/or frequency tuning, a relatively narrow ion energy distribution maybe formed, and an etching distribution in a radial direction of a wafermay be controlled. Alternatively or additionally, a matcher such as animpedance matched and passive components (e.g. filters, etc.) for asingle frequency may not be required or may not be used, andparticularly, the matcher may not be required because a voltage isdirectly applied to the chamber 20.

FIGS. 8, 9 and 10 are diagrams illustrating a variable frequency andnon-sinusoidal power generator according to some example embodiments.

FIG. 8 is a perspective view of an arrangement of the plurality ofswitches or power elements (e.g., the plurality of pulse controlswitches and the plurality of slope control switches) included in thevariable frequency and non-sinusoidal power generator. For example, FIG.8 illustrates an example of an arrangement of the first switchesincluded in the first control circuit 112. FIG. 9 is an enlargedperspective view of a part “A” in FIG. 8 , and a first cooling system orfirst cooling means CM1 and a second cooling system or second coolingmeans CM2 for cooling the plurality of switches are also illustrated inFIG. 9 . FIG. 10 is a cross-sectional view of the switch and the firstand second cooling means CM1 and CM2 in FIG. 9 .

Referring to FIG. 8 , the first switches S11, S12, S13, . . . may besequentially disposed (e.g., serially disposed) along one direction.

To distribute the high voltage and to distribute the generated heat, thepower elements (e.g., the first switches S11, S12, S13, . . . ) may beimplemented in a series connection manner. To simultaneously turn on thepower elements, a passive balancing scheme may be applied.

If the switching speed of the power element is increased depending onthe increase in frequency, the heat generation may increase inproportion to the frequency. For example, if the frequency is increasedabout 8 times from about 100 kHz to about 800 kHz, the heat generationmay also increase about 8 times. Thus, to more stably operate withoutdamage to the power element, it may be necessary or desirable to managethe temperature below a specific temperature during operation, and atechnology for distributing the heat from the power element and ahigh-performance cooling technology may be required or utilized. Todistribute the heat, the plurality of power elements may be connected inseries and may be turned on at the same time. For example, the outputvoltage may have a voltage level of about several hundred V to severaltens of kV, and since a single power element cannot endure heat due topower loss when operating at about several hundred kHz, the heat may bedistributed by connecting the plurality of power elements in series.

Alternatively or additionally, to reduce parasitic inductance causingdistortion to the waveform, the first switches S11, S12, S13, . . . maybe arranged on a straight line.

Although not illustrated in FIG. 8 , as with the first switches S11,S12, S13, . . . , each of the second switches S21 to S2N included in thesecond control circuit 114, the third switches S31 to S3N included inthe third control circuit 116, the fourth switches S41 to S4N includedin the fourth control circuit 118, the fifth switches S51 to S5Nincluded in the fifth control circuit 122, the sixth switches S61 to S6Nincluded in the sixth control circuit 124, the seventh switches S71 toS7N included in the seventh control circuit 126, and the eighth switchesS81 to S8N included in the eighth control circuit 128 may also besequentially disposed in one direction.

Referring to FIGS. 9 and 10 , a variable frequency and non-sinusoidalpower generator includes a switch (or power element) 200, a firstcooling system or first cooling means CM1 and a second cooling system orsecond cooling means CM2. The variable frequency and non-sinusoidalpower generator may further include a cold plate 210, a fan 220, athermal pad 230, thermal pastes 240 a and 240 b, and a heat sink 250.

The switch 200 may be one of the plurality of pulse control switches andthe plurality of slope control switches included in the pulse modulecircuit 110 and the slope module circuit 120. For example, the switch200 may be the switch S12 among the first switches S11, S12, S13, . . .included in the first control circuit 112 in FIG. 8 . For example, theswitch 200 may operate with a high voltage of about several kV.

The first cooling means CM1 may be disposed at (or on) a first side ofthe switch 200, e.g., at a first side of the plurality of pulse controlswitches and the plurality of slope control switches. The second coolingmeans CM2 may be disposed at a second side opposite to the first side ofthe switch 200, e.g., at a second side opposite to the first side of theplurality of pulse control switches and the plurality of slope controlswitches. For example, the first side may be a lower side of the switch200, and the second side may be an upper side of the switch 200.

The first and second cooling means CM1 and CM2 may have a coolingfunction for temperature control. The heat generated from the switch 200may be reduced and the temperature of the variable frequency andnon-sinusoidal power generator may be reduced by the first and secondcooling means CM1 and CM2. To increase the cooling performance, thevariable frequency and non-sinusoidal power generator may be implementedusing the double side cooling in which the cooling means CM1 and CM2 aredisposed at both sides (e.g., the upper and lower sides) with respect tothe switch 200.

In some example embodiments, the first and second cooling means CM1 andCM2 may be different types of cooling means. For example, the firstcooling means CM1 may include or be based on or have a tubing for orhave flowing water, and the second cooling means CM2 may include or bebased on or have flowing air and may include, for example, a fan. Thecooling performance may be improved, e.g. may be maximized using theforced air at the top and using the water cooling at the bottom.However, some example embodiments are not limited thereto.Alternatively, the second cooling means CM2 may include or be based onor have flowing water or may include at least one of various othercooling means, such as but not limited to other coolants such as variousrefrigerants.

The cold plate 210 may be disposed at the first side of the switch 200(e.g., disposed under the switch 200), and may be disposed between theswitch 200 and the first cooling means CM1. The cold plate 210 mayprovide a space for supplying the first cooling means CM1, and the firstcooling means CM1 may be stored and maintained in the cold plate 210.For example, the cold plate 210 may be connected to a ground voltage.

The cold plate 210 may include a plate part 212 on which the switch 200is disposed, and a plurality of fin structures 214 protruding from theplate part 212. The contact area with the first cooling means CM1 may beincreased by the plurality of fin structures 214, and thus theperformance and/or efficiency of heat transfer may be improved.

The fan 220 may be disposed at the second side of the switch 200 (e.g.,disposed on the switch 200). The second cooling means CM2, e.g. thesecond cooling system, may be supplied by the fan 220.

The thermal pad 230 may be disposed at the first side of the switch 200(e.g., disposed under the switch 200), and may be disposed between theswitch 200 and the cooling plate 210. The thermal pad 230 may include amaterial having a withstand voltage of several kV or more. For example,the thermal pad 230 may include aluminum nitride (AlN) having a thermalconductivity of about 170 W/m·K or more and an insulation voltage ofabout 14 kV or more.

The thermal paste 240 a may be disposed between the switch 200 and thethermal pad 230, and the thermal paste 240 b may be disposed between thethermal pad 230 and the cooling plate 210.

The heat sink 250 may be disposed at the second side of the switch 200(e.g., disposed on the switch 200), and may be disposed between theswitch 200 and the fan 220. For example, the heat sink 250 may be fixedby a clip type.

In some example embodiments, the cooling performance of the first andsecond cooling means CM1 and CM2 may be controlled depending on thefrequency of the bias power By. For example, when the frequency of thebias power BV increases, the cooling performance of the first and secondcooling means CM1 and CM2 may be increased and/or improved. For example,the cooling performance may be increased by increasing an amount ofwater (e.g., the first cooling means CM1), and/or a circulation speed ofwater, etc., and/or by increasing the rotation speed of the fan 220 forsupplying the air (e.g., the second cooling means CM2).

The variable frequency and non-sinusoidal power generator according tosome example embodiments may be implemented as illustrated in FIGS. 8, 9and 10 . Since the variable frequency and non-sinusoidal power generatoris implemented using the double side cooling, the heat generation by thefrequency change (e.g., increase) may be reduced, and the temperaturecontrol may be more efficiently performed.

FIGS. 11A, 11B, 12A, 12B, 13, 14, 15, 16, 17 and 18 are diagrams fordescribing an operation of a variable frequency and non-sinusoidal powergenerator according to some example embodiments.

Referring to FIGS. 11A and 11B, a voltage waveform of the bias power BVthat is generated by the variable frequency and non-sinusoidal powergenerator according to some example embodiments and is applied to thelower electrode 40 is illustrated.

FIG. 11A illustrates an example where the bias power BV has a firstfrequency (e.g. a first fundamental frequency), and FIG. 11B illustratesan example where the bias power BV has a second frequency (e.g. a secondfundamental frequency) higher than the first frequency. The slope of thevariable voltage level in the ramp interval T3 may be the same inexamples of FIGS. 11A and 11B. For example, the first frequency may beabout 100 kHz, and the second frequency may be about 800 kHz. Forexample, as will be described with reference to FIGS. 16 and 17 , thefrequency of the bias power BV may be changed for each step in a processof manufacturing a semiconductor device (e.g., in the same process), andthe frequency of the bias power BV may be changed in real time duringthe process.

Referring to FIGS. 12A and 12B, a wafer potential WP (e.g., a voltage)on the substrate W induced by the bias power BV of FIGS. 11A and 11B anda plasma potential PP in the plasma space P of the chamber 20 areillustrated.

The bias power BV may be self-biased under the influence of theelectrostatic chuck 30 disposed at the lower side and a plasma sheathdisposed at the upper side to form the wafer potential WP having anegative offset. A sheath potential may correspond to a potentialdifference between the wafer potential WP and the plasma potential PP,and ions, such as reactive ions, incident on the substrate W may becontrolled depending on the sheath potential. Alternatively oradditionally, the wafer potential WP and the plasma potential PP may bedifferent depending on the frequency of the bias power By.

Referring to FIG. 13 , an ion energy by the bias power BV of FIGS. 11Aand 11B is illustrated. In FIG. 13 and subsequent figures, F1 maycorrespond to the first frequency (e.g. first low fundamental frequency)of FIG. 11A, and F2 may correspond to the second frequency (e.g. secondlarger fundamental frequency) of FIG. 11B.

The ion energy may be determined by the sheath potential, which is thepotential difference between the wafer potential WP and the plasmapotential PP, and the frequency of the bias power By. As illustrated inFIG. 13 , the profile of the ion energy may be adjusted depending on thefrequency of the bias power By. For example, as the frequency of thebias power BV increases, a central value of the ion energy may increase.

Referring to FIG. 14 , an ion incident angle by the bias power BV ofFIGS. 11A and 11B is illustrated.

Typically, a relatively high ion energy may have a small incident angle,and a relatively low ion energy may have a large incident angle. In awafer having patterns, as the incident angle is smaller, the ions may beimplanted narrower and/or deeper; for example, there may be a higheramount of anisotropy and/or a deeper potential aspect ratio with asmaller incident angle. As illustrated in FIG. 14 , the ion incidentangle may also be adjusted depending on the frequency of the bias powerBy.

Referring to FIG. 15 , a plasma density in the radial direction of thewafer by the bias power BV of FIGS. 11A and 11B is illustrated. As aradial position is smaller, it may be closer to a center of the wafer.

When the frequency of the bias power BV increases, it can be seen thatthe plasma density is relatively increased at the second frequency F2compared to the first frequency F1, and at the center of the wafercompared to the outermost part of the wafer. The etching rate at thecenter of the wafer may be increased by increasing the frequency of thebias power By. For example, the plasma density in the radial directionof the wafer may be controlled by adjusting the frequency of the biaspower BV, and the etching distribution in the radial direction of theentire wafer may be controlled by controlling the plasma density.

Referring to FIGS. 16 and 17 , the plasma power PV and the bias power BVthat are applied to the plasma processing apparatus in the process ofmanufacturing the semiconductor device are illustrated.

The process of manufacturing the semiconductor device may includevarious steps based on a plurality of recipes, and one process mayinclude a plurality of steps. FIG. 16 illustrates an example where theprocess includes three steps STEP1-1, STEP2-1 and STEP3-1, and FIG. 17illustrates an example where the process includes two steps STEP1-2 andSTEP2-2.

In an example of FIG. 16 , the first step STEP1-1 may be or may includea step of removing oxides and/or process by-products, the second stepSTEP2-1 may be or may include a step of protecting the etching side, andthe third step STEP3-1 may be or may include a step of etching to anarrow and deep portion. The first step STEP1-1 may be referred to as abreak through step, the second step STEP2-1 may be referred to as anoxidation step, and the third step STEP3-1 may be referred to as a mainetching step.

In some example embodiments, during the first step STEP1-1, the biaspower supply BV may be activated to have a first frequency and a firstamplitude. During the second step STEP2-1, the bias power BV may bedeactivated. During the third step STEP3-1, the bias power BV may beactivated to have a second frequency different from the first frequencyand a second amplitude different from the first amplitude. For example,the bias power BV having a relatively low frequency and a smallamplitude may be used in the first step STEP1-1 to increase the etchingfor the outer part of the wafer/substrate W, and the bias power BVhaving a relatively high frequency and a large amplitude may be used inthe third step STEP3-1 to improve the etching of the center of thewafer/substrate W. For example, the frequency of the bias power BV maybe changed in real time during the process.

The plasma power PV may have different amplitudes during the first stepSTEP1-1, the second step STEP2-1, and the third step STEP3-1, but thefrequency of the plasma power PV may be fixed.

In an example of FIG. 17 , the first step STEP1-2 may be or may includea step of removing oxides or process by-products, and the second stepSTEP2-2 may be or may include a step of etching to a narrow and deepportion. The first step STEP1-2 and the second step STEP2-2 maycorrespond to the first step STEP1-1 and the third step STEP3-1 in FIG.16 , respectively.

In some example embodiments, during the first step STEP1-2, the biaspower supply BV may have the first frequency and the first amplitude.During the second step STEP2-2, the bias power BV may have the secondfrequency and the second amplitude. The plasma power PV may havedifferent amplitudes and the fixed frequency during the first stepSTEP1-2 and the second step STEP2-2.

In some example embodiments, as described with reference to FIGS. 4through 7 , the frequency of the bias power BV may be changed byadjusting lengths of the pulse interval T1, the first transitioninterval T2, the ramp interval T3 and the second transition interval T4based on the plurality of pulse control signals PC and the plurality ofslope control signals SC.

In some example embodiments, the amplitude of the bias power BV may bechanged based on the first and second current control signals CC1 andCC2. For example, based on the first current control signal CC1, theamount of the first input current IS1 generated from the first currentsource 111 may be changed, and the fixed voltage level in the pulseinterval T1 may be changed from a first fixed voltage level to a secondfixed voltage level. Based on the second current control signal CC2, theamount of the second input current IS2 generated from the second currentsource 121 may be changed, and the variable voltage level in the rampinterval T3 may be changed from a first variable voltage level to asecond variable voltage level.

Referring now to FIG. 18 , an etching process on a semiconductor deviceusing the plasma processing apparatus is illustrated.

The semiconductor device may include a semiconductor layer 310 and amask layer 320. For example, the semiconductor layer 310 may include Si,and the mask layer 320 may include a nitride and/or an organic materialsuch as a photoresist and/or SiO₂.

In some example embodiments, the mask layer 320 may include a pluralityof openings. For example, the plurality of openings may have differentdiameters/widths/lengths. The etching process may be performed to form afirst opening having a first diameter/width D1 and a second openinghaving a second diameter/width D2.

When the bias power BV having the variable frequency and thenon-sinusoidal waveform is used or applied according to some exampleembodiments, the ion energy having a relatively narrow single peak (ormono-peak) may be formed, as illustrated in FIGS. 13 and 14 . Thus, whenthe etching process is performed using the bias power BV, thestraightness (or directivity or anisotropy) of ions may be improved, anetching profile of the semiconductor device may be improved, and thebowing or loss of anisotropy may be reduced. The ions may reach a narrowand deep region due to the high straightness of ions, and thus adifference between a depth of a widely-etched area and a depth of anarrowly-etched area (e.g., a difference between a depth of the firstopening and a depth of the second opening), for example, an intra cell(IC) loading, may be removed. For example, the IC loading may refer tonon-uniform patterns formed in a cell region of the semiconductor devicecaused by or related to different etching rates between differentpattern widths, or the IC loading may be a phenomenon that an etchingrate depends on pattern widths. Alternatively or additionally, theplasma density in the radial direction of the wafer may be controlled bythe frequency change, and thus the etching distribution in the radialdirection of the wafer may be controlled.

FIGS. 19A, 19B, 19C, 19D, 19E, 19F and 19G are diagrams for describingan operation of a variable frequency and non-sinusoidal power generatoraccording to some example embodiments.

Referring to FIGS. 19A, 19B, 19C, 19D, 19E, 19F and 19G, at least one ofthe slope of the variable voltage level in the ramp interval T3, a ratioof the length of the pulse interval T1 and the length of the rampinterval T3, and a ratio of a length of a first interval in which thebias power BV is activated and a length of a second interval in whichthe bias power BV is deactivated may be additionally adjusted.

In some example embodiments, as illustrated in FIGS. 19A, 19B, 19C and19D, a wafer potential WP induced on the surface of the substrate W maybe controlled by the negative slope in the ramp interval T3. The slopeof the variable voltage level in the ramp interval T3 may be selectedsuch that the wafer potential WP induced on the surface of the substrateW has a desired/predetermined constant value. For example, a graph P3 ofFIG. 19C may be selected from among graphs P1, P2, P3 and P4 of FIGS.19A, 19B, 19C and 19D. The slope of the variable voltage level in theramp interval T3 may be adjusted to thereby prevent the surface of thesubstrate W from being charged positively with positive ions.

In some example embodiments, as illustrated in FIG. 19E, an ion energydistribution on the substrate W may be controlled by the negative slopein the ramp interval T3. The slope of the variable voltage level in theramp interval T3 (e.g., the graph P3) may be selected such that the ionenergy distribution having a narrow single peak. The slope of thevariable voltage level in the ramp interval T3 may be adjusted tothereby control the ion energy distribution on the surface of thesubstrate W.

In some example embodiments, as illustrated in FIG. 19F, the ratio ofthe length of the pulse interval T1 and the length of the ramp intervalT3 in the bias power BV, e.g., a time ratio (e.g., t1/t2) of the rampinterval T3 to a cycle of the bias power BV within one period/cycle ofthe bias power BV, or simply the duration ratio of the ramp interval T3to a cycle of the bias power BV, may be adjusted. For example, theduration ratio of the ramp interval T3 may be adjusted while the slopeof the variable voltage level in the ramp interval T3 is maintained atthe determined value. For example, the duration ratio of the rampinterval T3 to the corresponding period/cycle may be adjusted within arange of about 20% to about 80%. For example, a graph G1 may represent acase that the duration ratio of the ramp interval T3 is adjusted about30%, a graph G2 may represent a case that the duration ratio of the rampinterval T3 is adjusted about 40%, a graph G3 may represent a case thatthe duration ratio of the ramp interval T3 is adjusted about 50%, and agraph G4 may represent a case that the duration ratio of the rampinterval T3 is adjusted about 70%.

In some example embodiments, as illustrated in FIG. 19G, a ratio of alength of a first interval TA in which the bias power BV is activatedand a length of a second interval TD in which the bias power BV isdeactivated, e.g., an on/off duty ratio of the bias power BV within aprocess period/cycle, may be adjusted. For example, the ratio of thelength of the first interval TA and the length of the second interval TDmay be adjusted within a range of about 5% to about 95%. The ratio ofthe length of the first interval TA and the length of the secondinterval TD may be adjusted to thereby remove efficiently a gas andprocess by-products within a pattern (opening) formed during an etchingprocess.

FIG. 20 is a flowchart illustrating a method of generating a variablefrequency and non-sinusoidal power according to some exampleembodiments.

Referring to FIGS. 4 through 10 and 20 , in a method of generating avariable frequency and non-sinusoidal power according to some exampleembodiments, at least one of the first output current IO1 and the firstoutput voltage is generated by selectively turning on and off theplurality of pulse control switches based on the plurality of pulsecontrol signals PC (step S100). At least one of the second outputcurrent IO2 and the second output voltage by selectively turning on andoff the plurality of slope control switches based on the plurality ofslope control signals SC (step S200). The bias power BV is generatedbased on at least one of the first output current IO1 and the firstoutput voltage, and at least one of the second output current IO2 andthe second output voltage (step S300). Steps S100, S200 and S300 may beperformed by the pulse module circuit 110, the slope module circuit 120and the plasma load 140, respectively, and may be substantiallysimultaneously performed.

As described above, the bias power BV has the variable frequency and thenon-sinusoidal waveform. For example, the frequency of the bias power BVmay be changed by adjusting the turn-on times, the turn-off times and/orthe switching timings (or switching speeds) of the plurality of pulsecontrol switches and the plurality of slope control switches.Alternatively or additionally, the frequency of the bias power BV may bechanged for each step in the process of manufacturing the semiconductordevice, and the frequency of the bias power BV may be changed in realtime during the process. Alternatively or additionally, the amplitude ofthe bias power BV may also be changed based on the first and secondcurrent control signals CC1 and CC2.

The plurality of pulse control switches and the plurality of slopecontrol switches are cooled using the first cooling system/first coolingmeans CM1 and the second system/second cooling means CM2 (step S400).The cooling performance may be improved using the double side cooling,and the heat generation by the frequency increase may be efficientlyreduced.

FIG. 21 is a flowchart illustrating a method of performing plasmaprocessing according to some example embodiments.

Referring to FIGS. 1, 2 and 21 , in a method of performing plasmaprocessing according to some example embodiments, the substrate W isloaded onto the lower electrode 40 within the chamber 20 (step S1100). Aprocess gas is supplied within the chamber 20 (step S1200).

For example, the substrate W such as the semiconductor wafer may beloaded on the electrostatic chuck 30 of the substrate stage within thechamber 20. The process gas (for example, an etching process gas) may beintroduced into the chamber 20 through the gas supply lines 60 a and 60b, and then a pressure of the chamber 20 may be controlled to adesired/predetermined vacuum level by the gas exhaust unit 26.

After that, the plasma power PV is applied by the sinusoidal powergenerator 51 to the upper electrode 50 to form the plasma within thechamber 20 (step S1300). The plasma power PV has the sinusoidalwaveform. The bias power BV is applied by the variable frequency andnon-sinusoidal power generator 41 to the lower electrode 40 (stepS1400). The bias power BV has the variable frequency and thenon-sinusoidal waveform. An etching process is performed on the layer onthe substrate W (step S1500). Step S1400 may be performed based on themethod of generating the variable frequency and non-sinusoidal poweraccording to some example embodiments described with reference to FIG.20 .

For example, when the plasma power PV having the fixed frequency (forexample, about 13.56 MHz) and the sinusoidal waveform is applied fromthe sinusoidal power generator 51 to the upper electrode 50, anelectromagnetic field induced by the upper electrode 50 may be appliedto a source gas within the chamber 20 to generate the plasma. Forexample, when the bias power BV having the variable frequency and thenon-sinusoidal waveform is applied from the variable frequency andnon-sinusoidal power generator 41 to the lower electrode 40, the ionenergy distribution having a relatively narrow single peak may begenerated on the surface of the substrate W. Thus, a controllability ofan etching profile may be improved. For example, the layer on thesubstrate W may include at least one of a metal layer, a metal nitridelayer, an insulation layer, a semiconductor layer, etc. Alternatively,the layer on the substrate W may be omitted, and the substrate W may bea layer to be etched, for example during an etch of a silicon substrate.

FIG. 22 is a flowchart illustrating a method of manufacturing asemiconductor device according to some example embodiments.

Referring to FIGS. 1 and 22 , in a method of manufacturing asemiconductor device according to some example embodiments, the plasmaprocessing is performed on the substrate (step S2100). The semiconductordevice is fabricated using the substrate on which the plasma processingis performed (step S2200). Step S2100 may be performed based on themethod of performing the plasma processing according to some exampleembodiments described with reference to FIG. 21 .

Inventive concepts may be embodied as a system, method, computer programproduct, and/or a computer program product embodied in one or morecomputer readable medium(s) having computer readable program codeembodied thereon. The computer readable program code may be provided toa processor of a general purpose computer, special purpose computer, orother programmable data processing apparatus. The computer readablemedium may be a computer readable signal medium or a computer readablestorage medium. The computer readable storage medium may be any tangiblemedium that can contain or store a program for use by or in connectionwith an instruction execution system, apparatus, or device. For example,the computer readable medium may be a non-transitory computer readablemedium.

Inventive concepts may be applied to various semiconductor devices andmanufacturing processes of the semiconductor devices. For example,inventive concepts may be applied to the manufacturing processes of thesemiconductor devices such as a memory device, a processing device, etc.For example, inventive concepts may be applied to the manufacturingprocesses of systems including the memory device and the processingdevice such as a personal computer (PC), a server computer, a datacenter, a workstation, a mobile phone, a smart phone, a tablet computer,a laptop computer, a personal digital assistant (PDA), a portablemultimedia player (PMP), a digital camera, a portable game console, amusic player, a camcorder, a video player, a navigation device, awearable device, an internet of things (IoT) device, an internet ofeverything (IoE) device, an e-book reader, a virtual reality (VR)device, an augmented reality (AR) device, a robotic device, a drone,etc.

Any of the elements disclosed above may include or be implemented inprocessing circuitry such as hardware including logic circuits; ahardware/software combination such as a processor executing software; ora combination thereof. For example, the processing circuitry morespecifically may include, but is not limited to, a central processingunit (CPU), an arithmetic logic unit (ALU), a digital signal processor,a microcomputer, a field programmable gate array (FPGA), aSystem-on-Chip (SoC), a programmable logic unit, a microprocessor,application-specific integrated circuit (ASIC), etc.

The foregoing is illustrative of some example embodiments and is not tobe construed as limiting thereof. Although some example embodiments havebeen described, those of ordinary skill in the art will readilyappreciate that many modifications are possible in example embodimentswithout materially departing from the teachings and/or advantages of theexample embodiments. Accordingly, all such modifications are intended tobe included within the scope of example embodiments as defined in theclaims. Therefore, it is to be understood that the foregoing isillustrative of various example embodiments and is not to be construedas limited to any specific example embodiments disclosed, and thatmodifications to example embodiments, as well as other exampleembodiments, are intended to be included within the scope of theappended claims. Still further none of the example embodiments arenecessarily mutually exclusive to one another. For example some exampleembodiments may include features described with reference to one or morefigures, and may also include other features described with reference toone or more other figures.

What is claimed is:
 1. A variable frequency and non-sinusoidal powergenerator comprising: a pulse module circuitry including a plurality ofpulse control switches, and configured to generate at least one firstoutput current or first output voltage, the generating the at least onefirst output current or first output voltage by selectively turning onand off the plurality of pulse control switches based on a plurality ofpulse control signals, at least some of the plurality of pulse controlswitches being in series; a slope module circuitry including a pluralityof slope control switches, and configured to generate at least onesecond output current or second output voltage, the generating the atleast one second output current or second output voltage by selectivelyturning on and off the plurality of slope control switches based on aplurality of slope control signals, at least some of the plurality ofslope control switches being in series; a first cooling system at afirst side of the plurality of pulse control switches and the pluralityof slope control switches; and a second cooling system at a second sideopposite to the first side of the plurality of pulse control switchesand the plurality of slope control switches, wherein the variablefrequency and non-sinusoidal power generator generates a bias powerhaving a variable frequency and a non-sinusoidal waveform based on theplurality of pulse control signals, the plurality of slope controlsignals, at least one of the first output current or the first outputvoltage, and at least one of the second output current or the secondoutput voltage.
 2. The variable frequency and non-sinusoidal powergenerator of claim 1, wherein: the bias power has a voltage waveformthat repeats every period, and the period includes a pulse interval inwhich the bias power has a first fixed voltage level that is greaterthan a reference voltage level, a ramp interval in which the bias powerhas a first variable voltage level that is less than the referencevoltage level and decreases with a constant slope, a first transitioninterval for changing the pulse interval to the ramp interval, and asecond transition interval for changing the ramp interval to the pulseinterval.
 3. The variable frequency and non-sinusoidal power generatorof claim 2, wherein the variable frequency and non-sinusoidal powergenerator changes a frequency of the bias power by adjusting lengths ofthe pulse interval, the ramp interval, the first transition interval,and the second transition interval, the adjusting the lengths based onthe plurality of pulse control signals and the plurality of slopecontrol signals.
 4. The variable frequency and non-sinusoidal powergenerator of claim 2, wherein the pulse module circuit includes: a firstcurrent source connected between a first node and a second node; a firstcontrol circuitry connected between the first node and a first outputnode, and including first switches and first diodes, the first switchesturning on and off based on a first pulse control signal; a secondcontrol circuitry connected between the first node and a second outputnode, and including second switches and second diodes, the secondswitches turning on and off based on a second pulse control signal; athird control circuitry connected between the first output node and thesecond node, and including third switches and third diodes, the thirdswitches turning on and off based on a third pulse control signal; and afourth control circuitry connected between the second output node andthe second node, and including fourth switches and fourth diodes, thefourth switches turning on and off based on a fourth pulse controlsignal.
 5. The variable frequency and non-sinusoidal power generator ofclaim 4, wherein: the first switches and the first diodes arealternately arranged between the first node and the first output nodeand are connected in series, the second switches and the second diodesare alternately arranged between the first node and the second outputnode and are connected in series, the third switches and the thirddiodes are alternately arranged between the first output node and thesecond node and are connected in series, and the fourth switches and thefourth diodes are alternately arranged between the second output nodeand the second node and are connected in series.
 6. The variablefrequency and non-sinusoidal power generator of claim 5, wherein theslope module circuitry includes: a second current source connectedbetween a third node and a fourth node; a fifth control circuitryconnected between the third node and the first output node, andincluding fifth switches and fifth diodes, the fifth switches turning onand off based on a first slope control signal; a sixth control circuitryconnected between the third node and the second output node, andincluding sixth switches and sixth diodes, the sixth switches turning onand off based on a second slope control signal; a seventh controlcircuitry connected between the first output node and the fourth node,and including seventh switches and seventh diodes, the seventh switchesturning on and off based on a third slope control signal; and an eighthcontrol circuitry connected between the second output node and thefourth node, and including eighth switches and eighth diodes, the eighthswitches turning on and off based on a fourth slope control signal. 7.The variable frequency and non-sinusoidal power generator of claim 6,wherein: the fifth switches and the fifth diodes are alternatelyarranged between the third node and the first output node and areconnected in series, the sixth switches and the sixth diodes arealternately arranged between the third node and the second output nodeand are connected in series, the seventh switches and the seventh diodesare alternately arranged between the first output node and the fourthnode and are connected in series, and the eighth switches and the eighthdiodes are alternately arranged between the second output node and thefourth node and are connected in series.
 8. The variable frequency andnon-sinusoidal power generator of claim 6, wherein: during the pulseinterval, the second switches, the fourth switches, the sixth switchesand the eighth switches simultaneously turn on, and the first switches,the third switches, the fifth switches and the seventh switchessimultaneously turn off, during the first transition interval, thesecond switches, the third switches, the sixth switches and the eighthswitches simultaneously turn on, and the first switches, the fourthswitches, the fifth switches and the seventh switches simultaneouslyturn off, during the ramp interval, the first switches, the thirdswitches, the sixth switches and the seventh switches simultaneouslyturn on, and the second switches, the fourth switches, the fifthswitches and the eighth switches simultaneously turn off, and during thesecond transition interval, the first switches, the fourth switches, thefifth switches and the seventh switches simultaneously turn on, and thesecond switches, the third switches, the sixth switches and the eighthswitches simultaneously turn off.
 9. The variable frequency andnon-sinusoidal power generator of claim 6, wherein: based on a firstcurrent control signal, the variable frequency and non-sinusoidal powergenerator changes an amount of a first input current generated from thefirst current source, and the variable frequency and non-sinusoidalpower generator changes the first fixed voltage level in the pulseinterval to a second fixed voltage level, and based on a second currentcontrol signal, the variable frequency and non-sinusoidal powergenerator changes an amount of a second input current generated from thesecond current source, and the variable frequency and non-sinusoidalpower generator changes the first variable voltage level in the rampinterval to a second variable voltage level.
 10. The variable frequencyand non-sinusoidal power generator of claim 9, wherein the amount of thefirst input current is greater than the amount of the second inputcurrent.
 11. The variable frequency and non-sinusoidal power generatorof claim 2, wherein the variable frequency and non-sinusoidal powergenerator is configured to additionally adjust at least one of a slopeof the first variable voltage level, a ratio of a length of the pulseinterval to a length of the ramp interval, or a ratio of a length of afirst interval in which the bias power is activated to a length of asecond interval in which the bias power is deactivated.
 12. The variablefrequency and non-sinusoidal power generator of claim 1, furthercomprising: a control signal generator circuitry configured to generatethe plurality of pulse control signals and the plurality of slopecontrol signals.
 13. The variable frequency and non-sinusoidal powergenerator of claim 1, wherein the first cooling system and the secondcooling system are different types of cooling system.
 14. The variablefrequency and non-sinusoidal power generator of claim 13, wherein thefirst cooling system includes water, and the second cooling systemincludes at least one of air or water.
 15. The variable frequency andnon-sinusoidal power generator of claim 1, further comprising: a coldplate between the first cooling system and at least one of the pluralityof pulse control switches or the plurality of slope control switches.16. The variable frequency and non-sinusoidal power generator of claim15, wherein the cold plate includes: a plate part on which the pluralityof pulse control switches and the plurality of slope control switchesare arranged; and a plurality of fin structures protruding from theplate part.
 17. The variable frequency and non-sinusoidal powergenerator of claim 15, further comprising: a thermal pad between thecold plate and at least one of the plurality of pulse control switchesor the plurality of slope control switches.
 18. A plasma processingapparatus comprising: a chamber; a substrate stage configured to supporta substrate within the chamber, and including a lower electrode; anupper electrode over the lower electrode to face the substrate; asinusoidal power generator configured to apply a plasma power to theupper electrode to form plasma within the chamber, the plasma powerhaving a sinusoidal waveform; and a variable frequency andnon-sinusoidal power generator configured to apply a bias power to thelower electrode, the bias power having a variable frequency and anon-sinusoidal waveform, and wherein the variable frequency andnon-sinusoidal power generator includes, a pulse module circuitryincluding a plurality of pulse control switches, and configured togenerate at least one of a first output current or a first outputvoltage by selectively turning on and off the plurality of pulse controlswitches, the turning on and off the plurality of pulse control switchesbased on a plurality of pulse control signals, at least some of theplurality of pulse control switches arranged in series, a slope modulecircuitry including a plurality of slope control switches, andconfigured to generate at least one of a second output current or asecond output voltage by selectively turning on and off the plurality ofslope control switches, the turning on and off the plurality of pulsecontrol switches based on a plurality of slope control signals, at leastsome of the plurality of slope control switches arranged in series, afirst cooling system at a first side of the plurality of pulse controlswitches and the plurality of slope control switches, and a secondcooling system at a second side opposite to the first side of theplurality of pulse control switches and the plurality of slope controlswitches, and wherein the variable frequency and non-sinusoidal powergenerator is configured to generate the bias power based on theplurality of pulse control signals, the plurality of slope controlsignals, at least one of the first output current and the first outputvoltage, and at least one of the second output current and the secondoutput voltage.
 19. The plasma processing apparatus of claim 18,wherein: during a first step in a process of manufacturing asemiconductor device, the bias power has a first frequency and a firstamplitude, and during a second step different from the first step in theprocess of manufacturing the semiconductor device, the bias power has asecond frequency different from the first frequency and a secondamplitude different from the first amplitude.
 20. A variable frequencyand non-sinusoidal power generator comprising: a pulse module circuitryincluding a first current source and a plurality of pulse controlswitches, and configured to generate at least one of a first outputcurrent or a first output voltage by adjusting an amount of a firstinput current generated from the first current source based on a firstcurrent control signal and by selectively turning on and off theplurality of pulse control switches, the turning on and off theplurality of pulse control switches based on a plurality of pulsecontrol signals, at least some of the plurality of pulse controlswitches arranged in series; a slope module circuitry including a secondcurrent source and a plurality of slope control switches, and configuredto generate at least one of a second output current or a second outputvoltage by adjusting an amount of a second input current generated fromthe second current source based on a second current control signal andby selectively turning on and off the plurality of slope controlswitches, the selectively turning on and off the plurality of slopecontrol switches based on a plurality of slope control signals, at leastsome of the plurality of slope control switches being arranged inseries; a control signal generator circuitry configured to generate thefirst current control signal, the plurality of pulse control signals,the second current control signal, and the plurality of slope controlsignals; a first cooling system at a first side of the plurality ofpulse control switches and the plurality of slope control switches; asecond cooling system at a second side opposite to the first side of theplurality of pulse control switches and the plurality of slope controlswitches; a cold plate including a plurality of fin structures, andarranged between the first cooling system and at least one of theplurality of pulse control switches and the plurality of slope controlswitches; and a thermal pad between the cold plate and at least one ofthe plurality of pulse control switches and the plurality of slopecontrol switches, wherein the variable frequency and non-sinusoidalpower generator is configured to generate a bias power having a variablefrequency and a non-sinusoidal waveform based on the plurality of pulsecontrol signals, the plurality of slope control signals, at least one ofthe first output current or the first output voltage, and at least oneof the second output current or the second output voltage, the biaspower has a voltage waveform that repeats every period, and the periodincludes a pulse interval in which the bias power has a first fixedvoltage level that is greater than a reference voltage level, a rampinterval in which the bias power has a first variable voltage level thatis less than the reference voltage level and decreases with a constantslope, a first transition interval for changing the pulse interval tothe ramp interval, and a second transition interval for changing theramp interval to the pulse interval.